주제분류(KDC/DDC) |
공학, 공업일반
|
5,595
|
6
|
|
주제어 |
celldefect
|
1
|
1
|
|
celllevel
|
1
|
1
|
|
failbitpattern
|
1
|
1
|
|
multiple hypothesis testing
|
1
|
1
|
|
wafer map image
|
1
|
1
|
|
weighted decision tree
|
1
|
1
|
|
acceleratedfailuretimemodel
|
2
|
1
|
|
controllimit
|
2
|
1
|
|
coxphmodel
|
2
|
1
|
|
deliverytime
|
2
|
1
|
|
mcsvm
|
2
|
1
|
|
plasma display panel
|
2
|
1
|
|
support vectors
|
2
|
1
|
|
wafer test
|
2
|
1
|
|
package test
|
3
|
1
|
|
semiconductormanufacturingpro ...
|
3
|
1
|
|
semiconductor process
|
5
|
1
|
|
under-sampling
|
5
|
1
|
|
quality prediction
|
6
|
1
|
|
imbalanceddata
|
20
|
2
|
|
optics
|
15
|
1
|
|
count data model
|
18
|
1
|
|
statistical process control
|
18
|
1
|
|
multi collinearity
|
19
|
1
|
|
controlchart
|
29
|
1
|
|
semiconductor
|
77
|
1
|
|
feature extraction
|
135
|
1
|
|
survival analysis
|
137
|
1
|
|
계 |
|
6,107 |
35 |
|
* 주제로 분류 되지 않은 논문건수 |
|
0 |
|