주제어 |
New Defect Pattern Detectio ...
|
1
|
1
|
|
nonparametric feature selecti ...
|
2
|
1
|
|
probe test
|
3
|
1
|
|
quality prediction
|
6
|
2
|
|
virtual metrology
|
10
|
3
|
|
Wafer Bin Map
|
4
|
1
|
|
yield prediction
|
10
|
2
|
|
Convolution Neural Networks
|
6
|
1
|
|
semiconductor industry
|
25
|
3
|
|
smote
|
17
|
2
|
|
Semiconductor
|
108
|
2
|
|
transfer learning
|
85
|
1
|
|
classification
|
887
|
4
|
|
Deep Learning
|
1,788
|
1
|
|
Machine Learning
|
1,367
|
1
|
|
계 |
|
4,319 |
26 |
|
* 주제로 분류 되지 않은 논문건수 |
|
0 |
|