TSV 인터포저 기술을 이용한 3D 패키지의 방열 해석

논문상세정보
' TSV 인터포저 기술을 이용한 3D 패키지의 방열 해석' 의 주제별 논문영향력
논문영향력 선정 방법
논문영향력 요약
주제
  • system in package
  • thermal analysis
  • through-siliconviainterposer
동일주제 총논문수 논문피인용 총횟수 주제별 논문영향력의 평균
74 0

0.0%

' TSV 인터포저 기술을 이용한 3D 패키지의 방열 해석' 의 참고문헌

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    E. Kim MICROELECTRONICS RELIABILITY 48 : 1102 ~ 1105 [2008]
  • Thermal Modeling and Characterization of Package with Through-Silicon-Vias (TSV) Interposer
    X. Q. Xing Proc. 13th Electronics Packaging Technology Conference (EPTC) : 548 ~ [2011]
  • Thermal Management of 3D IC Integration with TSV (Through Silicon Via)
    J. H. Lau Proc. 59th Electronic Components and Technology Conference (ECTC) : 635 ~ [2009]
  • Thermal Evaluation and Analyses of 3D IC Integration SiP with TSV for Network System Application
    H. C. Chien Proc. 62nd ECTC : 1866 ~ [2012]
  • Temperature Aware Architecture: Lessons and Opportunities
    H. Wei IEEE Micro 31 (3) : 82 ~ [2011]
  • Reliability Challenges in 3D IC Packaging Technology
    K. N. Tu Microelectron. Reliab. 51 : 517 ~ [2011]
  • Nanotechnology and Mathematical Methods for High-Performance Thermal Interface Materials
    S. N. Paisner Global SMT & Packaging 5 (8) : 36 ~ [2008]
  • Multi- Stack Flip Chip 3D Packaging with Copper Plated Through- Silicon Vertical Interconnection
    R. Hon Proc. 7th EPTC : 384 ~ [2005]
  • Integration Challenges of Copper Through Silicon Via (TSV) Metallization for 3D-Stacked IC Integration
    J. Vaes Microelectron. Eng. 88 (50) : 745 ~ [2011]
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    S. G. Singh Proc. IEEE International Conference on 3D System Integration (3DIC) : 1 ~ [2009]
  • Evolution, Challenge, and Outlook of TSV, 3D IC Integration and 3D Silicon Integration
    J. H. Lau Proc. International Symposium on Advanced Packaging Materials (APM) : 462 ~ [2011]
  • Effects of TSVs (Through-Silicon Vias) on Thermal Performances of 3D IC Integration Systemin- Package (SiP)
    J. H. Lau Microelectron. Reliab. 52 (11) : 2660 ~ [2012]
  • Effect of TSV Interposer on the Thermal Performance of FCBGA Package
    Y. Y. G. Hoe Proc. 11th EPTC : 778 ~ [2009]
  • Development of Through Silicon Via (TSV) Interposer Technology for Large Die (21×21 mm) Fine-Pitch Cu/Low-k FCBGA Package
    X. zhang Proc. 59th ECTC : 305 ~ [2009]
  • Comparison of Thermal Performance Between Glass and Silicon Interposers
    S. B. Cho Proc. 63rd ECTC : 1480 ~ [2013]
  • Characterization of Nanostructured Thermal Interface Materials-A Review
    A. J. McNamara Int. J. Therm. Sci. 62 : 2 ~ [2012]
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    De Micheli, G. Pavlidis, V.F. Xu, H. Proc. Design, Automation & Test in Europe Conference & Exhibition (DATE) : 1 ~ [2011]
  • 3D IC 열관리를 위한 TSV Liquid Cooling System
    박만석 마이크로전자 및 패키징학회지 20 (3) : 1 ~ 6 [2013]