연구동향 분석

Analysis of Random Variations and Variation-Robust Advanced Device Structures

Hyohyun Nam Gyo Sub Lee Hyun Jae Lee In Jun Park Changhwan Shin 2014년

논문상세정보
인용/피인용
' Analysis of Random Variations and Variation-Robust Advanced Device Structures' 의 주제별 논문영향력
논문영향력 선정 방법
논문영향력 요약
주제
  • 전자공학
  • cmos
  • fd-soimosfet
  • finfet
  • junctionlessmosfet
  • mosfet
  • random variation
  • segfet
  • tri-gatemosfet
  • variability
동일주제 총논문수 논문피인용 총횟수 주제별 논문영향력의 평균
2,635 0

0.0%

' Analysis of Random Variations and Variation-Robust Advanced Device Structures' 의 참고문헌

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