연구동향 분석

Method of Ga removal from a specimen on a microelectromechanical system-based chip for in-situ transmission electron microscopy

Yena Kwon Byeong-Seon An Yeon Ju Shin 양철웅 2020년

논문상세정보
인용/피인용
' Method of Ga removal from a specimen on a microelectromechanical system-based chip for in-situ transmission electron microscopy' 의 주제별 논문영향력
논문영향력 선정 방법
논문영향력 요약
주제
  • Focused ion beam Ex-situ lift-out system Ga residue MEMS-based chip Ar+ ion milling
동일주제 총논문수 논문피인용 총횟수 주제별 논문영향력의 평균
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' Method of Ga removal from a specimen on a microelectromechanical system-based chip for in-situ transmission electron microscopy' 의 참고문헌

  • Theory and new applications of ex situ lift out
  • The focused ion beam instrument
    F.A. Stevie [2005]
  • TEM Sample Preparation Using a Focused Ion Beam and a Probe Manipulator
  • NarrowBeam Argon Ion Milling of Ex Situ Lift-out FIB Specimens Mounted on Various Carbon-Supported Grids
    M.J. Campin [2018]
  • Focused ion beam preparation of specimens for micro-electro-mechanical system-based transmission electron microscopy heating experiments
    S. Vijayan [2017]
  • Focused ion beam milling and micromanipulation lift out for site specific cross-section TEM specimen preparation
  • FIB Lamella Sample Preparation on to MEMS Nano-Chips for In Situ TEM Applications
    Y. Pivak [2017]
  • Effective removal of Ga residue from focused ion beam using a plasma cleaner
    D. S. Ko [2007]
  • Effect of gallium focused ion beam milling on preparation of aluminum thin foils
    K. A. Unoci [2010]
  • Convenient preparation of high-quality specimens for annealing experiments in the transmission electron microscope
    M. Duchamp [2014]
  • A MEMS-based heating holder for the direct imaging of simultaneous in-situ heating and biasing experiments in scanning/transmission electron microscopes
    L. Mele [2016]