연구동향 분석

모폴로지를 이용한 마스크 기반 에지 검출 알고리즘에 관한 연구

이창영 김남호 Lee, Chang-Young Kim, Nam-Ho 2015년

논문상세정보
인용/피인용
' 모폴로지를 이용한 마스크 기반 에지 검출 알고리즘에 관한 연구' 의 주제별 논문영향력
논문영향력 선정 방법
논문영향력 요약
주제
  • edge detection
  • image enhancement
  • mask
  • morphology
  • 마스크
  • 모폴로지
  • 에지 검출
  • 영상 개선
동일주제 총논문수 논문피인용 총횟수 주제별 논문영향력의 평균
691 0

0.0%

' 모폴로지를 이용한 마스크 기반 에지 검출 알고리즘에 관한 연구' 의 참고문헌

  • Real-time optical character recognition on field programmable gate array for automatic number plate recognition system
    Xiaojun Zhai Circuits, Devices & Systems, IET 7 (6) : 337 ~ 344 [2013]
  • Performance analysis between aparapi (a parallel API) and JAVA by implementing sobel edge detection Algorithm
    Gupta K.G. National Conference on Parallel Computing Technologies : 1 ~ 5 [2013]
  • Max Roberts Operator is a Hueckel-Type Edge Detector
    Rosenfeld Azriel IEEE Trans. on Pattern Analysis and Machine Intelligence PAMI-3 (1) : 101 ~ 103 [1981]
  • Image retrieval based on blocked histogram and Sobel edge detection algorithm
    Hongyan Sun International Conference on Computer Science and Service System : 3277 ~ 3281 [2011]
  • Image Denoising Using Edge Model-based Representation of Laplacian Subbands
    Nema M.K. International Conference on Advances in Pattern Recognition : 329 ~ 332 [2009]
  • Edge detection of SAR images using incorporate shift-invariant DWT and binarization method
    Wang Can International Conference on Signal Processing 1 : 745 ~ 748 [2012]
  • An edge detection algorithm based-on Sobel operator for images captured by binocular microscope
    Hua Xiang International Conference on Electrical and Control Engineering : 980 ~ 982 [2011]
  • An Improved Edge Detection Using Morphoogical Laplacian of Gaussian Operator
    Ashish Anand International Conference on Signal Processing and Intergrated Networks : 532 ~ 536 [2015]
  • A novel approach for contrast enhancement based on Histogram Equalization
    Yeganeh H. International Conference on Computer and Communication Engineering : 256 ~ 260 [2008]
  • A Threshold Selection Method from Gray-Level Histograms
    Nobuyuki Otsu IEEE Trans. on Systems, Man.., and Cybernetics SMC-9 (1) : 62 ~ 66 [1979]
  • A New Defect Inspection Method for TFT-LCD Panel using Pattern Comparison
    Kyong-Min Lee The transaction of the korean institute of electrical engineers : 307 ~ 313 [2008]