Probing of Surface Potential Using Atomic Force Microscopy

논문상세정보
' Probing of Surface Potential Using Atomic Force Microscopy' 의 주제별 논문영향력
논문영향력 선정 방법
논문영향력 요약
주제
  • atmomicforcemicroscopy
  • electrostaticforcemicroscopy
  • kelvin probe force microscopy
  • surface charge
  • surface potential
동일주제 총논문수 논문피인용 총횟수 주제별 논문영향력의 평균
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' Probing of Surface Potential Using Atomic Force Microscopy' 의 참고문헌

  • ac driving amplitude dependent systematic error in scanning Kelvin probe microscope measurements: detection and correction
    Wu Y Rev. Sci. Instrum 77 : 043711 ~ [2006]
  • Time-resolved electrostatic force microscopy of polymer solar cells
    Coffey D C Nat. Mater 5 : 735 ~ 740 [2006]
  • The effect of nitrogen incorporation on surface properties of silicon oxynitride films
    Hong J Phys. Rapid Res. Lett 3 : 25 ~ 27 [2009]
  • Surface potential mapping of SAM-functionalized organic semiconductors by Kelvin probe force microscopy
    Ellison D J Adv. Mater 23 : 502 ~ 507 [2011]
  • Spatial charge separation in asymmetric nanostructure of Au nanoparticle on TiO2 nanotube by light-induced surface potential imaging
    Yoo H Nano Lett 14 : 4413 ~ 4417 [2014]
  • Screening phenomena on oxide surfaces and its implications for local electrostatic and transport measurements
    Kalinin S V Nano Lett 4 : 555 ~ 560 [2004]
  • Practical aspects of single-pass scan Kelvin probe force microscopy
    Li G Y Rev. Sci. Instrum 83 : 113701 ~ [2012]
  • Practical aspects of Kelvin probe force microscopy
    Jacobs H O Rev. Sci. Instrum 70 : 1756 ~ 1760 [1999]
  • Polarization dynamics in ferroelectric capacitors:local perspective on emergent collective behavior and memory effects
    Vasudevan R Adv. Funct. Mater 23 : 2490 ~ 2508 [2013]
  • Open loop Kelvin probe force microscopy with single and multi-frequency excitation
    Collins L Nanotechnology 24 : 475702 ~ [2013]
  • Local potential and polarization screening on ferroelectric surfaces
    Kalinin S V Phys. Rev. B 63 : 125411 ~ [2001]
  • Kelvin probe force microscopy without bias-voltage feedback
    Takeuchi O Jpn. J. Appl. Phys 46 : 5626 ~ 5630 [2007]
  • Kelvin probe force microscopy on InAs thin films on (110) GaAs substrates
    Takahashi T Jpn. J. Appl. Phys 39 : 3721 ~ 3723 [2000]
  • Kelvin probe force microscopy
    Nonnenmacher M Appl. Phys. Lett 58 : 2921 ~ 2923 [1991]
  • Kelvin Probe Force Microscopy
    Sadewasser S Springer : 7 ~ 24 [2012]
  • Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substrate
    Gady B Phys. Rev. B 53 : 8065 ~ 8070 [1996]
  • Electrostatic force microscopy: principles and some applications to semiconductors
    Girard P Nanotechnology 12 : 485 ~ 490 [2001]
  • Electronic characterization of organic thin films by Kelvin probe force microscopy
    Palermo V Adv. Mater 18 : 145 ~ 164 [2006]
  • Effect of local surface potential distribution on its relaxation in polycrystalline ferroelectric films
    Kim Y J. Appl. Phys 107 : 054103 ~ [2010]
  • Contact electricity of metals
    Kelvin L Philos. Mag 46 : 82 ~ 120 [1898]