연구동향 분석

CCA를 통한 반도체 공정 변인들의 상관성 분석

김승민 ( Seung Min Kim ) 백준걸(Jun-Geol Baek) 2015년

논문상세정보
인용/피인용
' CCA를 통한 반도체 공정 변인들의 상관성 분석' 의 주제별 논문영향력
논문영향력 선정 방법
논문영향력 요약
주제
  • canonical correlation analysis
  • cca
  • failbit
  • voltage
  • wafer test process
동일주제 총논문수 논문피인용 총횟수 주제별 논문영향력의 평균
95 0

0.0%

' CCA를 통한 반도체 공정 변인들의 상관성 분석' 의 참고문헌

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