연구동향 분석

Dependence of Electrons Loss Behavior on the Nitride Thickness and Temperature for Charge Trap Flash Memory Applications

Tang, Zhenjie Ma, Dongwei Jing, Zhang Jiang, Yunhong Wang, Guixia Li, Rong Yin, Jiang 2014년

논문상세정보
인용/피인용
' Dependence of Electrons Loss Behavior on the Nitride Thickness and Temperature for Charge Trap Flash Memory Applications' 의 주제별 논문영향력
논문영향력 선정 방법
논문영향력 요약
주제
  • chargetrapping
  • electronslossbehavior
  • memorydevice
동일주제 총논문수 논문피인용 총횟수 주제별 논문영향력의 평균
15 0

0.0%

' Dependence of Electrons Loss Behavior on the Nitride Thickness and Temperature for Charge Trap Flash Memory Applications' 의 참고문헌

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