연구동향 분석

프로브 검사 결점 수 데이터를 이용한 패키지 칩 품질 예측 방법론

박진수(Jinsoo Park) 김성범(Seoung Bum Kim) 2015년

논문상세정보
인용/피인용
' 프로브 검사 결점 수 데이터를 이용한 패키지 칩 품질 예측 방법론' 의 주제별 논문영향력
논문영향력 선정 방법
논문영향력 요약
주제
  • 공학, 공업일반
  • non-parametric feature selection
  • probe test
  • quality prediction
  • smote
동일주제 총논문수 논문피인용 총횟수 주제별 논문영향력의 평균
5,605 0

0.0%

' 프로브 검사 결점 수 데이터를 이용한 패키지 칩 품질 예측 방법론' 의 참고문헌

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