연구동향 분석

검사지연시간을 고려한 SMT 검사기의 통합적 경로 계획 알고리즘

이철희(Chulhee Lee) 박태형(Tae-Hyoung Park) 2015년

논문상세정보
인용/피인용
' 검사지연시간을 고려한 SMT 검사기의 통합적 경로 계획 알고리즘' 의 주제별 논문영향력
논문영향력 선정 방법
논문영향력 요약
주제
  • 전자공학
  • aoi (automatic optical inspection)
  • clustering
  • genetic algorithm
  • path planning
  • traveling salesman problem
동일주제 총논문수 논문피인용 총횟수 주제별 논문영향력의 평균
3,095 0

0.0%

' 검사지연시간을 고려한 SMT 검사기의 통합적 경로 계획 알고리즘' 의 참고문헌

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