Worst Case Sampling Method with Confidence Ellipse for Estimating the Impact of Random Variation on Static Random Access Memory (SRAM)

Sangheon Oh Jaesung Jo Hyun Jae Lee Gyo Sub Lee Jung-Dong Park Changhwan Shin 2015년

논문상세정보

인용/피인용

논문영향력 요약
동일주제 총논문수	논문피인용 총횟수	주제별 논문영향력의 평균
주제	전자공학 random variation sram yield
2,619	1	0.0%

논문영향력
주제		주제별 논문수	주제별 피인용횟수	주제별 논문영향력
주제분류(KDC/DDC)	전자공학	2,302	0	0.0%
주제어	random variation	3	0	0.0%
	sram	22	0	0.0%
	yield	297	0	0.0%
계		2,624	0	0.0%
* 다른 주제어 보유 논문에서 피인용된 횟수			1

Worst case sampling method to estimate the impact of random variation on static random access memory
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