연구동향 분석

8-포트회로망을 이용한 온-웨이퍼형 DUT의 잡음파라미터 측정

이동현(Dong-Hyun Lee) 압둘-라흐만(Abdule-Rahman Ahmed) 이성우(Sung-Woo Lee) 염경환(Kyung-Whan Yeom) 2014년

논문상세정보
인용/피인용
' 8-포트회로망을 이용한 온-웨이퍼형 DUT의 잡음파라미터 측정' 의 주제별 논문영향력
논문영향력 선정 방법
논문영향력 요약
주제
  • 전자공학
  • 6-port network
  • noise parameters
  • on-wafermeasurement
동일주제 총논문수 논문피인용 총횟수 주제별 논문영향력의 평균
2,305 0

0.0%

' 8-포트회로망을 이용한 온-웨이퍼형 DUT의 잡음파라미터 측정' 의 참고문헌

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  • The six-port reflectometer : an alternative network analyzer
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  • The determination of device noise parameter
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    염경환 2013년도 한국전자파학회 하계종합학술대회 1 (1) [2013]
  • Noise parameter measurement using an 8-port network
    압둘 2014년도 마이크로파및전파전파합동학술대회논문집 37 (1) : 33 ~ [2014]
  • New ultra fast noise parameter test system
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