연구동향 분석

A Convolutional Neural Network Model for Wafer Map Defect Identification in Semiconductor Manufacturing Process = 반도체 제조 공정에서 웨이퍼 맵 결함 식별을 위한 컨볼루션 신경망 모델

Muhammad Saqlain 2021년

논문상세정보
인용/피인용
' A Convolutional Neural Network Model for Wafer Map Defect Identification in Semiconductor Manufacturing Process = 반도체 제조 공정에서 웨이퍼 맵 결함 식별을 위한 컨볼루션 신경망 모델' 의 주제별 논문영향력
논문영향력 선정 방법
논문영향력 요약
주제
  • Convolutional Neural Network
  • Data Augmentation
  • Deep Learning
  • Patterns Recognition
  • Wafer Map Defect Inspection
  • Wafer Maps
동일주제 총논문수 논문피인용 총횟수 주제별 논문영향력의 평균
2,173 0

0.0%

' A Convolutional Neural Network Model for Wafer Map Defect Identification in Semiconductor Manufacturing Process = 반도체 제조 공정에서 웨이퍼 맵 결함 식별을 위한 컨볼루션 신경망 모델' 의 참고문헌

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