[29] Hong, S. H., "Binomial and Multinomial Logistic Regression"ㆍ KoyUgKwaHagSa : 7 ~ 40, 2011
7 ~ 40[2011]
[22] Jung, H. C., Kang, C. W., Kang, H. W., "Dynamic Yield Improvement Model Using Neural Networks", Journal of Society of Korea Industrial and Systems Engineering Vol, 32, No.2 : 132-139, June 2009
[20] Jung, H. J., Koo, B. C., "Optimization of Robust Design Model using Data Mining" Journal of Society of Korea Industrial and Systems Engineering Vol, 30, No.2 : 99-105, June 2007.
[18] Seifert, J.W., Data Mining: An Overview,CRS Report RL31798, 2004.
[2004]
The latest technology trend and development prospect of power semiconductor
[2009]
Study for wet cleaning of semiconductor metal contaminants on polycarbonate
12 ~ 18[2015]
Semiconductor yield improvement : results and best practices , Semiconductor Manufacturing.
8 ( 2 ) : 103-109
Semiconductor Industry Status and Future Preparation
78 ~ 81[2019]
Probe test yield optimization based onCanonicalCorrelation analysis between processControl monitoring variables and probe bin variables.
39 ( 4 ) :4377-4382[2012]
Optimization of Air Pollutant Emissions in theCement Firing Process Using a Response Surface Method
18 ( 4 ) :356-369 .[2018]
Multi-response Optimization by a Response Surface Approach for a Taguchi-Type Multi-charateristic Experiments.
4 ( 1 ) :39-64 .[2004]
Mixed Nano Silica Colloidal Slurry for Reliability Improvement of Sapphire Wafer CMP Process.
14 ( 1 ) :11-19[2014]
Mastering Datamining Master ''
110 ~ 150[2014]
Market and Technology Development Trends of Power IC
206 ~ 215 ,[2013]
MINITAB Multivariate analysis for Practitioners
181 ~ 203[2001]
Introduction of robust statistical techniques in data mining
18[2000]
Hyeon Dae Design Of Experimental
453 ~ 485[2003]
Hybrid data mining approach for pattern extraction from wafer bin map to improve yield in semiconductor manufacturing.
107 ( 1 ) :88-103[2007]
Green Power Electronics Technology ''
Evaluation of Fracture Strength of Silicon Wafer for Semiconductor Substrate by Point Load Test Method.
16 ( 1 ) :21-31[2016]
Datamining for yield enhancement in semiconductor manufacturing and an empirical study.
33 ( 1 ) :192-198 .[2007]
Data Mining Techniques and Applications
22 ~ 73 , 191 ~ 289[2015]
Data Mining Methodology for Big Data Analysis
80 ~ 200,2017
Data Mining : Concepts and Techniques
[2015]
Current Status and Prospect of Design Technology of CMOS Image Sensor
73 ~ 83[2013]
Applocation of Generalized Linear Models to Predict Semiconductor Yield Using Defect Metrology Data.
24 ( 1 ) :44-58[2011]
Application of Data mining for improving and predicting yield in wafer fabrication system.
9 ( 1 ) :157–177[2003]
Analysis on engineer 's process event log in semiconductor processing with text mining technique 'Seoul University Dept
p1 ~ 11[2012]
A study on Data Mining Application Problem in the TFT-LCD Industry ''
JKDIS , vol16 ( 4 ) : 823-833 ,[2005]
A machine learning approach to yield management in semiconductor manufacturing.
38 ( 17 ) :4261-4271[2000]
A digital pixel sensor array with programmable dynamic range ''
A Yields Prediction in the Semiconductor Manufacturing Process Using Stepwise Support Vector Machine.
22 ( 3 ) : 252-262[2009]
A Study on Optimal Operation Conditions for an Electronic Device Alignment System by Using Design of Experiments.
43 ( 3 ) :453-466[2015]
A Study for Line Width Control in the Gate Etching Process using the BARC ( Bottom-Anti-Reflecting-Coating )
20 ~ 40 ,[2005]
A Quality Data Mining System in TFT-LCD Industry ''
34 ( 1 ) : 13-19[2006]
A Prediction of Wafer Yield Using Product Fabrication Virtual Metrology Process Parameters in Semiconductor Manufacturing.
41 ( 6 ) :572-578[2015]
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