박사

Atomic and electronic reconstruction at the a-LAO/STO interface by E-beam induced crystallization

논문상세정보
' Atomic and electronic reconstruction at the a-LAO/STO interface by E-beam induced crystallization' 의 주제별 논문영향력
논문영향력 선정 방법
논문영향력 요약
주제
  • aberrationcorrected scanning transmission electron microscope (STEM)
  • electron beam lithography
  • epitaxial crystallization
  • interfacial reconstruction
  • laalo3/srtio3
  • perovskite oxide
  • two-dimensional electron gas (2DEG)
  • 계면 재구성
  • 구면 수차 보정 주사 투과 전자 현미경
  • 에피택셜 결정화
  • 이차원 전자 가스
  • 전자빔 리소그래피
  • 페로브스카이트 산화물
동일주제 총논문수 논문피인용 총횟수 주제별 논문영향력의 평균
27 0

0.0%

' Atomic and electronic reconstruction at the a-LAO/STO interface by E-beam induced crystallization' 의 참고문헌

  • Z. Zhong, P. Xu, and P. J. Kelly, Physical Review B 82 (2010) 165127.
  • Z. Liu, Y.-C. Lin, C.-C. Lu, C.-H. Yeh, P.-W. Chiu, S. Iijima, and K. Suenaga, Nature communications 5 (2014).
  • Z. Liu, L. Sun, Z. Huang, C. Li, S. Zeng, K. Han, W. L , T. Venkatesan, and Ariando, Journal of Applied Physics 115 (2014) 054303.
  • Z. Gao, X. Huang, P. Li, L. Wang, L. Wei, W. Zhang, and H. Guo, Advanced Materials Interfaces 5 (2018) 1701565.
  • Y. Yoshino, K. Inoue, M. Takeuchi, and K. Ohwada, Vacuum 51 (1998) 601.
  • Y. W. Xie, Y. Hikita, C. Bell, and H. Y. Hwang, Nature Communications 2 (2011) 494.
  • Y. Tokura and N. Nagaosa, science 288 (2000) 462.
  • Y. Maeno, H. Hashimoto, K. Yoshida, S. Nishizaki, T. Fujita, J. Bednorz, and F. Lichtenberg, Nature 372 (1994) 532.
  • Y. Li, S. N. Phattalung, S. Limpijumnong, and J. Yu, arXiv preprint arXiv:0912.4805 (2009).
  • Y. Li, S. N. Phattalung, S. Limpijumnong, J. Kim, and J. Yu, Physical Review B 84 (2011) 245307.
  • Y. Kozuka et al., Physical Review B 84 (2011) 033304.
  • Y. Chen, N. Pryds, J. E. Kleibeuker, G. Koster, J. Sun, E. Stamate, B. Shen, G. Rijnders, and S. Linderoth, Nano letters 11 (2011) 3774.
  • Y. Chen, Microelectronic Engineering 135 (2015) 57.
  • X.-B. Lu, Z.-g. Liu, Y.-p. Wang, Y. Yang, X.-p. Wang, H.-w. Zhou, and B.-y. Nguyen, Journal of Applied Physics 94 (2003) 1229.
  • X. Wang, W. L , A. Annadi, Z. Liu, K. Gopinadhan, S. Dhar, and T. Venkatesan, Physical Review B 84 (2011) 075312.
  • X. Liu, R. Hong, and C. Tian, Journal of Materials Science: Materials in Electronics 20 (2009) 323.
  • X. Liu, R. Hong, and C. Tian, Journal of Materials Science: Materials in Electronics 20 (2008) 323.
  • X. Chen, T. Wu, G. Wu, R. Liu, H. Chen, and D. Fang, nature 453 (2008) 761.
  • W. Weber and H. Matzke, Materials Letters 5 (1986) 9.
  • W. Stratton, J. Hamann, J. Perepezko, and P. Voyles, Intermetallics 14 (2006) 1061.
  • W. Siemons, G. Koster, H. Yamamoto, W. A. Harrison, G. Lucovsky, T. H. Geballe, D. H. Blank, and M. R. Beasley, Physical review letters 98 (2007) 196802.
  • W. Luo, M. Varela, J. Tao, S. J. Pennycook, and S. T. Pantelides, Physical Review B 79 (2009) 052405.
  • W. Lu, P. Yang, W. D. Song, G. M. Chow, and J. S. Chen, Physical Review B 88 (2013) 214115.
  • W. L. Brown, T. Venkatesan, and A. Wagner, Nuclear Instruments and Methods in Physics Research 191 (1981) 157.
  • W. Clark, J. Chapman, A. Macleod, and R. Ferrier, Ultramicroscopy 5 (1980) 195.
  • V. Vonk, J. Huijben, D. Kukuruznyak, A. Stierle, H. Hilgenkamp, A. Brinkman, and S. Harkema, Physical Review B 85 (2012) 045401.
  • V. Primo-Martin and M. Jansen, Journal of Solid State Chemistry 157 (2001) 76.
  • V. M. Goldschmidt, Naturwissenschaften 14 (1926) 477.
  • T. Nagase, T. Sanda, A. Nino, W. Qin, H. Yasuda, H. Mori, Y. Umakoshi, and J. A. Szpunar, Journal of Non-Crystalline Solids 358 (2012) 502.
  • T. L. Kim and H. W. Jang, Current Applied Physics 17 (2017) 626.
  • T. Ishihara, Perovskite oxide for solid oxide fuel cells (Springer Science & Business Media, 2009).
  • T. E. Microscopy, Transmission Electron Microscopy,” Plenum (1996).
  • T. B scke, J. M ller, D. Br uhaus, U. Schr der, and U. B ttger, Applied Physics Letters 99 (2011) 102903.
  • S. von Moln r and P. Stampe, (John Wiley & Sons, Ltd, 2007).
  • S. Y. Moon, C. W. Moon, H. J. Chang, T. Kim, C.-Y. Kang, H.-J. Choi, J.-S. Kim, S.-H. Baek, and H. W. Jang, Nano Convergence 3 (2016) 7.
  • S. Y. Moon, C. W. Moon, H. J. Chang, T. Kim, C.-Y. Kang, H.-J. Choi, J.-S. Kim, S.-H. Baek, and H. W. Jang, Electronic Materials Letters 12 (2016) 243.
  • S. Watanabe, in Materials Science Forum (Trans Tech Publ, 2007), pp. 2021.
  • S. Wang, A. Y. Borisevich, S. N. Rashkeev, M. V. Glazoff, K. Sohlberg, S. J. Pennycook, and S. T. Pantelides, Nature Materials 3 (2004) 143.
  • S. Thiel, G. Hammerl, A. Schmehl, C. Schneider, and J. Mannhart, Science 313 (2006) 1942.
  • S. Seri and L. Klein, Physical Review B 80 (2009) 180410.
  • S. Satpathy, Z. S. Popović, and F. R. Vukajlović, Physical review letters 76 (1996) 960.
  • S. Royer and D. Duprez, ChemCatChem 3 (2011) 24.
  • S. Pennycook, M. Chisholm, A. Lupini, M. Varela, K. Van Benthem, A. Borisevich, M. Oxley, W. Luo, and S. Pantelides, Advances in Imaging and Electron Physics: Aberration-corrected Electron Microscopy 153 (2009) 327.
  • S. Pennycook et al., (Academic, New York, 2002).
  • S. Pauli et al., Physical review letters 106 (2011) 036101.
  • S. Okazaki, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 9 (1991) 2829.
  • S. May, J.-W. Kim, J. Rondinelli, E. Karapetrova, N. Spaldin, A. Bhattacharya, and P. Ryan, Physical Review B 82 (2010) 014110.
  • S. K. Kim, S.-I. Kim, H. Lim, D. S. Jeong, B. Kwon, S.-H. Baek, and J.-S. Kim, Scientific reports 5 (2015) 8023.
  • S. Jesse et al., Small 11 (2015) 5895.
  • S. J. Pennycook, M. Varela, C. J. Hetherington, and A. I. Kirkland, MRS bulletin 31 (2006) 36.
  • S. J. Pennycook et al., Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 367 (2009) 3709.
  • S. J. Pennycook and P. D. Nellist, Scanning transmission electron microscopy: imaging and analysis (Springer Science & Business Media, 2011).
  • S. I. Kim et al., Advanced Materials 25 (2013) 4612.
  • S. Gariglio, N. Reyren, A. Caviglia, and J. Triscone, Journal of Physics: Condensed Matter 21 (2009) 164213.
  • S. A. Chambers, Surface Science 605 (2011) 1133.
  • S. A. Chambers et al., Surface Science Reports 65 (2010) 317.
  • R.F. Egerton, Electron energy-loss spectroscopy in the electron microscope, Springer Science & Business Media, 2011.
  • R. Yamamoto, C. Bell, Y. Hikita, H. Y. Hwang, H. Nakamura, T. Kimura, and Y. Wakabayashi, Physical review letters 107 (2011) 036104.
  • R. Sun, Z. Wang, M. Saito, N. Shibata, and Y. Ikuhara, Nature communications 6 (2015) 7120.
  • R. Pentcheva and W. E. Pickett, Physical review letters 102 (2009) 107602.
  • R. M. Hazen, Scientific American 258 (1988) 74.
  • R. Lam, F. Wiss, and J. E. Greedan, Journal of Solid State Chemistry 167 (2002) 182.
  • R. Janes and E. A. Moore, Metal-ligand bonding (Royal society of chemistry, 2004).
  • R. Erni and N. D. Browning, Ultramicroscopy 108 (2008) 84.
  • R. Egerton, P. Li, and M. Malac, Micron 35 (2004) 399.
  • R. E. Cohen, Nature 358 (1992) 136.
  • R. Cooper, K. Smith, M. Colella, E. Vance, and M. Phillips, Journal of Nuclear Materials 289 (2001) 199.
  • R. C. Ewing and T. J. Headley, Journal of nuclear materials 119 (1983) 102.
  • Q. Xu, M.-Y. Wu, G. F. Schneider, L. Houben, S. K. Malladi, C. Dekker, E. Yucelen, R. E. Dunin-Borkowski, and H. W. Zandbergen, ACS nano 7 (2013) 1566.
  • P. Zubko, S. Gariglio, M. Gabay, P. Ghosez, and J.-M. Triscone, Annu. Rev. Condens. Matter Phys. 2 (2011) 141.
  • P. Zubko, N. Jecklin, A. Torres-Pardo, P. Aguado-Puente, A. Gloter, C. Lichtensteiger, J. Junquera, O. St phan, and J.-M. Triscone, Nano letters 12 (2012) 2846.
  • P. Yu, Y.-H. Chu, and R. Ramesh, Materials Today 15 (2012) 320.
  • P. Willmott et al., Physical Review Letters 99 (2007) 155502.
  • P. J. Phillips, M. De Graef, L. Kovarik, A. Agrawal, W. Windl, and M. Mills, Ultramicroscopy 116 (2012) 47.
  • P. E. Batson, N. Dellby, and O. L. Krivanek, Nature 418 (2002) 617.
  • P. Atkins and T. Overton, Shriver and Atkins' inorganic chemistry (Oxford University Press, USA, 2010).
  • P. A. Cox, Transition metal oxides: an introduction to their electronic structure and properties (Oxford university press, 2010), Vol. 27.
  • O. Nast and A. J. Hartmann, Journal of Applied Physics 88 (2000) 716.
  • O. Krivanek, in Inst. Phys. Conf. Ser.1997), 35.
  • O. Krivanek, N. Dellby, and A. Lupini, Ultramicroscopy 78 (1999) 1.
  • O. Ambacher et al., Journal of applied physics 85 (1999) 3222.
  • Nature Materials 11 (2012) 91.
  • N. Shibata, S. D. Findlay, Y. Kohno, H. Sawada, Y. Kondo, and Y. Ikuhara, Nature Physics 8 (2012) 611.
  • N. Shibata, S. D. Findlay, T. Matsumoto, Y. Kohno, T. Seki, G. S nchez-Santolino, and Y. Ikuhara, Accounts of chemical research 50 (2017) 1502.
  • N. Shibata, M. Chisholm, A. Nakamura, S. Pennycook, T. Yamamoto, and Y. Ikuhara, Science 316 (2007) 82.
  • N. Sai and D. Vanderbilt, Physical Review B 62 (2000) 13942.
  • N. Reyren et al., Science 317 (2007) 1196.
  • N. Nakagawa, H. Y. Hwang, and D. A. Muller, Nature materials 5 (2006) 204.
  • N. F. Mott, Proceedings of the Physical Society. Section A 62 (1949) 416.
  • N. Dellby, L. Krivanek, D. Nellist, E. Batson, and R. Lupini, Microscopy 50 (2001) 177.
  • N. Bristowe, P. Littlewood, and E. Artacho, Physical Review B 83 (2011) 205405.
  • N. Bristowe, P. Ghosez, P. B. Littlewood, and E. Artacho, Journal of Physics: Condensed Matter 26 (2014) 143201.
  • M. Zhang, Z. Chen, B. Mao, Q. Li, H. Bo, T. Ren, P. He, Z. Liu, and Y. Xie, Physical Review Materials 2 (2018) 065002.
  • M. Warusawithana et al., Nature communications 4 (2013) 2351.
  • M. W. Lufaso and P. M. Woodward, Acta Crystallographica Section B: Structural Science 60 (2004) 10.
  • M. Varela, M. Oxley, W. Luo, J. Tao, M. Watanabe, A. R. Lupini, S. Pantelides, and S. Pennycook, Physical Review B 79 (2009) 085117.
  • M. Varela, A. R. Lupini, K. v. Benthem, A. Y. Borisevich, M. F. Chisholm, N. Shibata, E. Abe, and S. J. Pennycook, Annu. Rev. Mater. Res. 35 (2005) 539.
  • M. Varela et al., Physical Review Letters 92 (2004) 095502.
  • M. V. Ganduglia-Pirovano, A. Hofmann, and J. Sauer, Surface Science Reports 62 (2007) 219.
  • M. Takizawa, S. Tsuda, T. Susaki, H. Hwang, and A. Fujimori, Physical Review B 84 (2011) 245124.
  • M. Tachibana, T. Shimoyama, H. Kawaji, T. Atake, and E. Takayama-Muromachi, Physical Review B 75 (2007) 144425.
  • M. T. Weller and M. T. Weller, Inorganic materials chemistry (Oxford University Press New York, 1994).
  • M. T. Greiner, L. Chai, M. G. Helander, W. M. Tang, and Z. H. Lu, Advanced Functional Materials 22 (2012) 4557.
  • M. St ger-Pollach, Micron 39 (2008) 1092.
  • M. St ger-Pollach and P. Schattschneider, Ultramicroscopy 107 (2007) 1178.
  • M. Salluzzo et al., Advanced Materials 25 (2013) 2333.
  • M. Reinle-Schmitt et al., Nature communications 3 (2012) 932.
  • M. Nord, P. E. Vullum, I. MacLaren, T. Tybell, and R. Holmestad, Advanced structural and chemical imaging 3 (2017) 9.
  • M. Minohara et al., Nano letters 14 (2014) 6743.
  • M. L. Jenkins and M. A. Kirk, Characterisation of radiation damage by transmission electron microscopy (CRC Press, 2000).
  • M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, and K. Urban, Nature 392 (1998) 768.
  • M. Haider, H. Rose, S. Uhlemann, E. Schwan, B. Kabius, and K. Urban, Ultramicroscopy 75 (1998) 53.
  • M. Ghita, M. Fornari, D. J. Singh, and S. Halilov, Physical Review B 72 (2005) 054114.
  • M. C. Biesinger, B. P. Payne, A. P. Grosvenor, L. W. Lau, A. R. Gerson, and R. S. C. Smart, Applied Surface Science 257 (2011) 2717.
  • M. Bibes, J. E. Villegas, and A. Barthelemy, Advances in Physics 60 (2011) 5.
  • M. Arredondo et al., Advanced Materials 22 (2010) 2430.
  • M. Abbate et al., Physical Review B 44 (1991) 5419.
  • M. A. Guillorn, D. W. Carr, R. C. Tiberio, E. Greenbaum, and M. L. Simpson, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 18 (2000) 1177.
  • L. Yu and A. Zunger, Nature communications 5 (2014) 5118.
  • L. Yao, S. Majumdar, L. k slompolo, S. Inkinen, Q. H. Qin, and S. van Dijken, Advanced Materials 26 (2014) 2789.
  • L. Qiao, T. Droubay, T. Kaspar, P. Sushko, and S. Chambers, Surface Science 605 (2011) 1381.
  • L. Qiao, T. C. Droubay, V. Shutthanandan, Z. Zhu, P. Sushko, and S. A. Chambers, Journal of Physics: Condensed Matter 22 (2010) 312201.
  • L. Qiao, T. C. Droubay, T. Varga, M. E. Bowden, V. Shutthanandan, Z. Zhu, T. C. Kaspar, and S. A. Chambers, Physical Review B 83 (2011) 085408.
  • L. Orgel, Discussions of the Faraday Society 26 (1958) 138.
  • L. M. Rodriguez-Martinez and J. P. Attfield, Physical Review B 54 (1996) R15622.
  • L. Li, C. Richter, J. Mannhart, and R. Ashoori, Nature physics 7 (2011) 762.
  • L. Hobbs, Introduction to analytical electron microscopy (1987) 399.
  • L. Gu et al., Physical Review B 75 (2007) 195214.
  • L. G. Tejuca and J. L. Fierro, Properties and applications of perovskite-type oxides (CRC Press, 1992).
  • L. D. Nguyen, L. E. Larson, and U. K. Mishra, Proceedings of the IEEE 80 (1992) 494.
  • K.-Y. Yang, W. Zhu, D. Xiao, S. Okamoto, Z. Wang, and Y. Ran, Physical Review B 84 (2011) 201104.
  • K.-G. Lim, K.-H. Chew, L.-H. Ong, and M. Iwata, EPL (Europhysics Letters) 99 (2012) 46004.
  • K. Yada, S. Onari, Y. Tanaka, and J.-i. Inoue, Physical Review B 80 (2009) 140509.
  • K. Van Benthem, C. Els sser, and R. French, Journal of Applied Physics 90 (2001) 6156.
  • K. Song et al., Nature nanotechnology 13 (2018) 198.
  • K. Smith, N. Zaluzec, R. Cooper, M. Colella, and E. Vance, Adv. Sci. Technol. 30 (2002) 15.
  • K. Naoto, H. Masataka, K. Hisao, H. Nobuyuki, S. Makoto, O. Fumihiko, and A. Masatoshi, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 59 (1991) 449.
  • K. Mkhoyan, T. Babinec, S. Maccagnano, E. Kirkland, and J. Silcox, Ultramicroscopy 107 (2007) 345.
  • K. Liu, P. Avouris, J. Bucchignano, R. Martel, S. Sun, and J. Michl, Applied Physics Letters 80 (2002) 865.
  • K. L. Smith, M. Colella, R. Cooper, and E. R. Vance, Journal of nuclear materials 321 (2003) 19.
  • K. I. i. Kugel' and D. Khomskiĭ, Physics-Uspekhi 25 (1982) 231.
  • K. G. Roberts, M. Varela, S. Rashkeev, S. T. Pantelides, S. J. Pennycook, and K. M. Krishnan, Physical review B 78 (2008) 014409.
  • K. Ariga, Q. Ji, W. Nakanishi, J. P. Hill, and M. Aono, Materials Horizons 2 (2015) 406.
  • J.-M. Tarascon, P. Barboux, P. Miceli, L. Greene, G. Hull, M. Eibschutz, and S. Sunshine, Physical Review B 37 (1988) 7458.
  • J.-L. Maurice et al., EPL (Europhysics Letters) 82 (2008) 17003.
  • J. Zhu, H. Li, L. Zhong, P. Xiao, X. Xu, X. Yang, Z. Zhao, and J. Li, Acs Catalysis 4 (2014) 2917.
  • J. Williams, J. Poate, G. Foti, and D. Jacobson, (Plenum, New York, 1983).
  • J. Wang and A. J. Davenport, Science 255 (1992) 1416.
  • J. W. Anthony, R. A. Bideaux, K. W. Bladh, and M. C. Nichols, Handbook of mineralogy (Mineral Data Publ. Tucson, 1990), Vol. 1.
  • J. Suntivich, K. J. May, H. A. Gasteiger, J. B. Goodenough, and Y. Shao-Horn, Science 334 (2011) 1383.
  • J. Parsons, R. Balluffi, and J. Koehler, Applied Physics Letters 1 (1962) 57.
  • J. P. Buban, H. Iddir, and S. ğ t, Physical Review B 69 (2004) 180102.
  • J. P. Attfield, P. Lightfoot, and R. E. Morris, Dalton Transactions 44 (2015) 10541.
  • J. Meyer, S. Hamwi, M. Kr ger, W. Kowalsky, T. Riedl, and A. Kahn, Advanced Materials 24 (2012) 5408.
  • J. M. Rondinelli and N. A. Spaldin, Advanced materials 23 (2011) 3363.
  • J. Lee, J. K. Choi, S. Y. Moon, J. Park, J.-S. Kim, C. S. Hwang, S.-H. Baek, J.-H. Choi, and H. J. Chang, Applied Physics Letters 106 (2015) 071601.
  • J. Jang, J. Y. Oh, S. K. Kim, Y. J. Choi, S. Y. Yoon, and C. O. Kim, Nature 395 (1998) 481.
  • J. Humphreys, R. Beanland, and P. J. Goodhew, Electron microscopy and analysis (CRC Press, 2014).
  • J. Goldstein, (Plenum Press, New York, 1979).
  • J. Gazquez, M. Stengel, R. Mishra, M. Scigaj, M. Varela, M. Roldan, J. Fontcuberta, F. S nchez, and G. Herranz, Physical review letters 119 (2017) 106102.
  • J. Garcia‐Barriocanal et al., Advanced Materials 22 (2010) 627.
  • J. Garcia-Barriocanal, A. Rivera-Calzada, M. Varela, Z. Sefrioui, E. Iborra, C. Leon, S. J. Pennycook, and J. Santamaria, Science 321 (2008) 676.
  • J. G. Bednorz and K. A. M ller, Zeitschrift f r Physik B Condensed Matter 64 (1986) 189.
  • J. G. Bednorz and K. A. M ller, Reviews of Modern Physics 60 (1988) 585.
  • J. E. Spanier, A. M. Kolpak, J. J. Urban, I. Grinberg, L. Ouyang, W. S. Yun, A. M. Rappe, and H. Park, Nano letters 6 (2006) 735.
  • J. Chapman, P. Batson, E. Waddell, and R. Ferrier, Ultramicroscopy 3 (1978) 203.
  • J. Chakhalian, A. Millis, and J. Rondinelli, Nature materials 11 (2012) 92.
  • J. Chakhalian et al., Physical review letters 107 (2011) 116805.
  • J. B. Torrance, P. Lacorro, C. Asavaroengchai, and R. M. Metzger, Journal of Solid State Chemistry 90 (1991) 168.
  • J. Alonso, M. Martinez-Lope, M. Casais, and M. Fernandez-Diaz, Inorganic chemistry 39 (2000) 917.
  • J. A. Bert, B. Kalisky, C. Bell, M. Kim, Y. Hikita, H. Y. Hwang, and K. A. Moler, Nature physics 7 (2011) 767.
  • I. MacLaren and Q. M. Ramasse, International Materials Reviews 59 (2014) 115.
  • I. Jenčič and I. Robertson, Journal of materials research 11 (1996) 2152.
  • I. Jencic, M. Bench, I. Robertson, and M. Kirk, Journal of applied physics 78 (1995) 974.
  • H.-T. Jeng, S.-H. Lin, and C.-S. Hsue, Physical review letters 97 (2006) 067002.
  • H.-R. Wenk and A. Bulakh, Minerals: their constitution and origin (Cambridge University Press, 2016).
  • H. Yamada, M. Kawasaki, Y. Ogawa, and Y. Tokura, Applied physics letters 81 (2002) 4793.
  • H. Y. Hwang, Y. Iwasa, M. Kawasaki, B. Keimer, N. Nagaosa, and Y. Tokura, Nature materials 11 (2012) 103.
  • H. W. Eng, P. W. Barnes, B. M. Auer, and P. M. Woodward, Journal of Solid State Chemistry 175 (2003) 94.
  • H. Takagi and H. Y. Hwang, Science 327 (2010) 1601.
  • H. St rmer, R. Dingle, A. Gossard, W. Wiegmann, and M. Sturge, Solid state communications 29 (1979) 705.
  • H. Rose, Phase contrast in scanning transmission electron microscopy. Optik 39, 416-436 1974), Vol. 39.
  • H. N. Lee, H. M. Christen, M. F. Chisholm, C. M. Rouleau, and D. H. Lowndes, Nature 433 (2005) 395.
  • H. Kroemer, Reviews of modern physics 73 (2001) 783.
  • H. Kroemer, International Journal of Modern Physics B 16 (2002) 677.
  • H. Jang et al., Science 331 (2011) 886.
  • H. J. Park, G. H. Ryu, and Z. Lee, Applied Microscopy 45 (2015) 107.
  • H. Chen, A. M. Kolpak, and S. Ismail-Beigi, Physical Review B 79 (2009) 161402.
  • G. Singh-Bhalla, C. Bell, J. Ravichandran, W. Siemons, Y. Hikita, S. Salahuddin, A. F. Hebard, H. Y. Hwang, and R. Ramesh, Nature Physics 7 (2011) 80.
  • G. S nchez-Santolino, J. Tornos, F. Y. Bruno, F. Cuellar, C. Leon, J. Santamar a, S. Pennycook, and M. Varela, Ultramicroscopy 127 (2013) 109.
  • G. Rijnders and D. H. Blank, Nature 433 (2005) 369.
  • G. Lulli, P. Merli, and M. V. Antisari, in MRS Proceedings (Cambridge Univ Press, 1988), p. 375.
  • G. Lulli, P. Merli, and M. V. Antisari, Physical Review B 36 (1987) 8038.
  • G. Lee, S. Y. Moon, J. Kim, S.-H. Baek, D. H. Kim, H. W. Jang, and H. J. Chang, RSC Advances 7 (2017) 40279.
  • G. Jonker and J. Van Santen, physica 16 (1950) 337.
  • G. Herranz, F. S nchez, N. Dix, M. Scigaj, and J. Fontcuberta, Scientific reports 2 (2012).
  • G. Herranz et al., Physical review letters 98 (2007) 216803.
  • G. E. Prawiroatmodjo, F. Trier, D. V. Christensen, Y. Chen, N. Pryds, and T. S. Jespersen, Physical Review B 93 (2016) 184504.
  • G. Duscher, R. Buczko, S. Pennycook, and S. T. Pantelides, Ultramicroscopy 86 (2001) 355.
  • G. Duscher, M. F. Chisholm, U. Alber, and M. R hle, Nature materials 3 (2004) 621.
  • G. De Luca, A. Rubano, E. d. Gennaro, A. Khare, F. M. Granozio, U. S. di Uccio, L. Marrucci, and D. Paparo, Applied Physics Letters 104 (2014) 261603.
  • F. Schwarzhuber, P. Melzl, and J. Zweck, Ultramicroscopy 177 (2017) 97.
  • F. Priolo and E. Rimini, Materials Science Reports 5 (1990) 321.
  • F. M. Granozio, G. Koster, and G. Rijnders, MRS bulletin 38 (2013) 1017.
  • F. Lu, Z. Dong, J. Zhang, T. White, R. C. Ewing, and J. Lian, RSC Advances 3 (2013) 15178.
  • F. Azough, R. Freer, and B. Schaffer, Journal of the American Ceramic Society 93 (2010) 1237.
  • E. Stoyanov, F. Langenhorst, and G. Steinle-Neumann, American Mineralogist 92 (2007) 577.
  • E. Okunishi, I. Ishikawa, H. Sawada, F. Hosokawa, M. Hori, and Y. Kondo, Microscopy and Microanalysis 15 (2009) 164.
  • E. Bousquet, M. Dawber, N. Stucki, C. Lichtensteiger, P. Hermet, S. Gariglio, J.-M. Triscone, and P. Ghosez, Nature 452 (2008) 732.
  • D. Vermilyea, Journal of the Electrochemical Society 104 (1957) 542.
  • D. Vermilyea, Journal of the Electrochemical Society 102 (1955) 207.
  • D. Taplin, N. Shibata, M. Weyland, and S. Findlay, Ultramicroscopy 169 (2016) 69.
  • D. Kan, R. Aso, H. Kurata, and Y. Shimakawa, Dalton transactions 44 (2015) 10594.
  • D. J. Singh, M. Ghita, M. Fornari, and S. Halilov, Ferroelectrics 338 (2006) 73.
  • D. Doennig, W. E. Pickett, and R. Pentcheva, Physical review letters 111 (2013) 126804.
  • D. Dikin, M. Mehta, C. Bark, C. Folkman, C. Eom, and V. Chandrasekhar, Physical Review Letters 107 (2011) 056802.
  • D. D. Fong, G. B. Stephenson, S. K. Streiffer, J. A. Eastman, O. Auciello, P. H. Fuoss, and C. Thompson, Science 304 (2004) 1650.
  • D. B. Williams and C. Carter, New York (2009).
  • C.-P. Chang et al., Physical Review B 87 (2013) 075129.
  • C. Zener, Physical Review 82 (1951) 403.
  • C. Yuan, H. B. Wu, Y. Xie, and X. W. Lou, Angewandte Chemie International Edition 53 (2014) 1488.
  • C. W. Schneider, S. Thiel, G. Hammerl, C. Richter, and J. Mannhart, Applied physics letters 89 (2006) 122101.
  • C. Vieu, F. Carcenac, A. Pepin, Y. Chen, M. Mejias, A. Lebib, L. Manin-Ferlazzo, L. Couraud, and H. Launois, Applied surface science 164 (2000) 111.
  • C. N. R. Rao, Annual Review of Physical Chemistry 40 (1989) 291.
  • C. Merckling, M. El-Kazzi, G. Delhaye, V. Favre-Nicolin, Y. Robach, M. Gendry, G. Grenet, G. Saint-Girons, and G. Hollinger, Journal of crystal growth 306 (2007) 47.
  • C. Li, Z. Liu, W. L , X. R. Wang, A. Annadi, Z. Huang, S. Zeng, and T. Venkatesan, Scientific reports 5 (2015) 13314.
  • C. Li et al., Scientific reports 8 (2018) 404.
  • C. Fu and K. Ho, Physical review letters 63 (1989) 1617.
  • C. Cen, S. Thiel, J. Mannhart, and J. Levy, Science 323 (2009) 1026.
  • C. Cen, S. Thiel, G. Hammerl, C. Schneider, K. Andersen, C. Hellberg, J. Mannhart, and J. Levy, Nature materials 7 (2008) 298.
  • C. Cantoni et al., Advanced Materials 24 (2012) 3952.
  • C. Cancellieri et al., Physical review letters 107 (2011) 056102.
  • C. Bark et al., Proceedings of the National Academy of Sciences 108 (2011) 4720.
  • C. Bark et al., Nano letters 12 (2012) 1765.
  • B.-C. Huang et al., Physical review letters 109 (2012) 246807.
  • B. Van Wees, H. Van Houten, C. Beenakker, J. G. Williamson, L. Kouwenhoven, D. Van der Marel, and C. Foxon, Physical Review Letters 60 (1988) 848.
  • B. Thomas, N. Marks, and B. Begg, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 254 (2007) 211.
  • B. Song, G. F. Schneider, Q. Xu, G. Pandraud, C. Dekker, and H. Zandbergen, Nano letters 11 (2011) 2247.
  • B. Rafferty and S. Pennycook, Ultramicroscopy 78 (1999) 141.
  • B. Noheda, J. Gonzalo, L. Cross, R. Guo, S.-E. Park, D. Cox, and G. Shirane, Physical Review B 61 (2000) 8687.
  • B. Kalisky, J. A. Bert, B. B. Klopfer, C. Bell, H. K. Sato, M. Hosoda, Y. Hikita, H. Y. Hwang, and K. A. Moler, Nature communications 3 (2012) 922.
  • B. Freitag, S. Kujawa, P. Mul, J. Ringnalda, and P. Tiemeijer, Ultramicroscopy 102 (2005) 209.
  • A. Y. Borisevich et al., Physical Review B 86 (2012) 140102.
  • A. W. Sleight, J. Gillson, and P. Bierstedt, Solid State Communications 88 (1993) 841.
  • A. Tebano, E. Fabbri, D. Pergolesi, G. Balestrino, and E. Traversa, Acs Nano 6 (2012) 1278.
  • A. Stanimirovic, N. Balzaretti, A. Feldman, and J. Graebner, Journal of Materials Research 16 (2001) 678.
  • A. Sawa, Materials today 11 (2008) 28.
  • A. Savoia et al., Physical Review B 80 (2009) 075110.
  • A. Sambri, D. Cristensen, F. Trier, Y. Chen, S. Amoruso, N. Pryds, R. Bruzzese, and X. Wang, Applied Physics Letters 100 (2012) 231605.
  • A. Ohtomo, D. Muller, J. Grazul, and H. Y. Hwang, nature 419 (2002) 378.
  • A. Ohtomo and H. Hwang, Nature 427 (2004) 423.
  • A. Lupini and S. Pennycook, Ultramicroscopy 96 (2003) 313.
  • A. Lubk and J. Zweck, Physical Review A 91 (2015) 023805.
  • A. Kalabukhov, Y. A. Boikov, I. Serenkov, V. Sakharov, J. B rjesson, N. Ljustina, E. Olsson, D. Winkler, and T. Claeson, EPL (Europhysics Letters) 93 (2011) 37001.
  • A. Kalabukhov, R. Gunnarsson, J. B rjesson, E. Olsson, T. Claeson, and D. Winkler, Physical Review B 75 (2007) 121404.
  • A. Kalabukhov et al., Physical review letters 103 (2009) 146101.
  • A. Heuberger, Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena 6 (1988) 107.
  • A. Caviglia, M. Gabay, S. Gariglio, N. Reyren, C. Cancellieri, and J.-M. Triscone, Physical review letters 104 (2010) 126803.
  • A. Broers, A. Hoole, and J. Ryan, Microelectronic Engineering 32 (1996) 131.
  • A. Brinkman et al., Nature materials 6 (2007) 493.
  • A. Bielański and J. Haber, Catalysis Reviews Science and Engineering 19 (1979) 1.
  • A. Bhattacharya and S. J. May, Annual Review of Materials Research 44 (2014) 65.
  • A. Bhalla, R. Guo, and R. Roy, Materials Research Innovations 4 (2000) 3.
  • A. Bhalla, R. Guo, and R. Roy, Material Research Innovations 4 (2000) 3.
  • A. Audouard, J. Balogh, J. Dural, and J. C. Jousset, Radiation Effects 62 (1982) 161.
  • A. Annadi et al., Nature communications 4 (2013) 1838.