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Transmission Electron Microscopy Specimen Preparation of Delicate Materials Using Tripod Polisher
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Cha, Hyun-Woo
Yang, Cheol-Woong
Shin, Keesam
Kang, Min-Chul
한국현미경학회[2016]
Google Scholar네이버 전문정보
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Optimal Conditions for Defect Analysis Using Electron Channeling Contrast Imaging
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Oh, Jin-Su
Yang, Cheol-Woong
한국현미경학회[2016]
Google Scholar네이버 전문정보
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Cross-Sectional Transmission Electron Microscopy Sample Preparation of Soldering Joint Using Ultramicrotomy
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Bae, Jee-Hwan
Yang, Cheol-Woong
Kwon, Ye-Na
한국현미경학회[2016]
Google Scholar네이버 전문정보
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