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Method to Prevent the Malfunction Caused by the Transformer Magnetizing Inrush Current using IEC 61850-based IEDs and Dynamic Performance Test using RTDS Test-bed
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Hae-Gweon Kang
Un-Sig Song
Se-Chang Kim
Jong-Soo Park
Jong-Eun Park
Jin-Ho Kim
대한전기학회[2014]
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