Lee, Byeong Hyeon

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제목	활용도	공유도	영향력
Investigation of the Contact Resistance Between Amorphous Silicon-Zinc-Tin-Oxide Thin Film Transistors and Different Electrodes Using the Transmission Line Method Han, Sangmin Lee, Sang Yeol Lee, Byeong Hyeon 한국전기전자재료학회[2016] Google Scholar 네이버 전문정보
Influence of Channel Thickness Variation on Temperature and Bias Induced Stress Instability of Amorphous SiInZnO Thin Film Transistors Lee, Byeong Hyeon Lee, Sang Yeol 한국전기전자재료학회[2017] Google Scholar 네이버 전문정보