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Characterization of Dielectric Relaxation and Reliability of High-k MIM Capacitor Under Constant Voltage Stress
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Choul-Young Kim
Sung-Kyu Kwon
Su Lim
Seung-Yong Sung
Hyuk-Min Kwon
Ho-Young Kwak
Hi-Deok Lee
Ga-Won Lee
대한전자공학회[2014]
Google Scholar네이버 전문정보
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Decrease of Parasitic Capacitance for Improvement of RF Performance of Multi-finger MOSFETs in 90-nm CMOS Technology
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Choul-Young Kim
Sung-Kyu Kwon
Sun-Ho Oh
Seong-Yong Jang
Jong-Kwan Shin
Jin-Woong Jeong
Jae-Nam Yu
Hyeong-Sub Song
Hi-Deok Lee
Ga-Won Lee
대한전자공학회[2015]
Google Scholar네이버 전문정보
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